The Microsystems and Nanotechnology Division at the National Institute of Standards and Technology (NIST) is searching for postdoctoral researchers who are motivated to improve the accuracy of measuring nanoscale features by scanning electron microscopy (SEM). This is your opportunity to work on projects that develop fundamental physics with practical applications to nanotechnology, ranging from transistors to nanoparticles! At NIST, you will gain experience and skills in measurement science that are highly valuable for a career in academia, industry, or a national laboratory. Accurate measurements by SEM require calibration of microscope characteristics and modeling of signal production in the sample. For suitably skilled postdoctoral candidates, we are prepared to launch theoretical or experimental projects in one or more of the following areas:

• Development of improved models for secondary electron generation, elastic scattering, electron-phonon scattering, and other electron transport phenomena, particularly at energies from 5 eV to 1 keV
• Design and fabrication in NIST’s NanoFab of samples that can be accurately measured by a reference technique and by SEM for validation of the latter, or reference samples with which to characterize the size, angle of incidence, and divergence of electron beams
• Measurements of emitted electron yields and spectra for the validation of electron transport models, particularly at energies of 5 eV to 1 keV

Experience of particular interest includes:

• Scanning electron microscopy
• Electron scattering models
• Density functional theory
• Mathematical methods of convolution, deconvolution, Fourier transforms, and model fitting
• MATLAB, Mathematica, or similar software
• Nanofabrication processes

Requirements:

• Ph.D. in Physics, Applied Physics, Electrical Engineering, or a related field
• Demonstrated ability to carry out research that demonstrates skills relevant to this project